The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 09, 2023

Filed:

Jun. 28, 2019
Applicants:

Chengdu Boe Optoelectronics Technology Co., Ltd., Chengdu, CN;

Boe Technology Group Co., Ltd., Beijing, CN;

Inventors:

Qun Ma, Beijing, CN;

Yuqing Yang, Beijing, CN;

Qiang Huang, Beijing, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 27/32 (2006.01);
U.S. Cl.
CPC ...
H01L 27/3218 (2013.01); H01L 27/3246 (2013.01); G09G 2300/0465 (2013.01); G09G 2320/0242 (2013.01); G09G 2330/12 (2013.01);
Abstract

A color shift compensation method, a display panel and a display device are provided. The color shift compensation method includes: acquiring color shift information generated with respect to a test region of a test display panel when the test region is viewed at a first viewing angle, at least a part of first subpixel units within the test region being provided with a test aperture ratio; and controlling, in accordance with the color shift information, at least a part of second subpixel units within a target region of a to-be-manufactured target display panel to be provided with a target aperture ratio being different from the test aperture ratio, to improve color shift within the target region when the target region is viewed at the first viewing angle, wherein a position of the target region on the target display panel is same as a position of the test region on the test display panel, and positions of at least the part of second subpixel units within the target region are same as positions of at least the part of first subpixel units within the test region.


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