The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 09, 2023

Filed:

Dec. 23, 2020
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Hao Ni, Beijing, CN;

Meifang Jing, Beijing, CN;

Shoufeng Wang, Beijing, CN;

Seho Kim, Suwon-si, KR;

Junyi Yu, Beijing, CN;

Jiajia Wang, Beijing, CN;

Xiaohui Yang, Beijing, CN;

Yi Zhao, Beijing, CN;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04B 7/06 (2006.01); H04B 7/0456 (2017.01); H04B 7/0408 (2017.01);
U.S. Cl.
CPC ...
H04B 7/0695 (2013.01); H04B 7/0408 (2013.01); H04B 7/0456 (2013.01); H04B 7/0617 (2013.01);
Abstract

A method for controlling a beam in a cell, includes obtaining traffic distribution data of a plurality of beam areas included in the cell, obtaining a total number of a plurality of beams for a beam area among the plurality of the beam areas, based on the obtained traffic distribution data, and obtaining a beam width of one among the plurality of beams for the beam area, based on the obtained total number of the plurality of beams. The method further includes obtaining, from a candidate beam set, candidate beams for the beam area, based on the obtained total number of the plurality of beams and the obtained beam width of the one among the plurality of beams, and obtaining, from the obtained candidate beams, multiple beams for the beam area, based on a distance between the obtained candidate beams and the beam area.


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