The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 09, 2023

Filed:

Dec. 05, 2019
Applicant:

Hkc Corporation Limited, Shenzhen, CN;

Inventor:

Wei Chen, Chongqing, CN;

Assignee:

HKC CORPORATION LIMITED, Shenzhen, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G09G 3/36 (2006.01);
U.S. Cl.
CPC ...
G09G 3/3648 (2013.01); G09G 3/3607 (2013.01); G09G 2320/0233 (2013.01); G09G 2340/16 (2013.01);
Abstract

The present application discloses methods for debugging and using an overdrive brightness value look-up table, and a display panel. The debugging method includes the following steps: measuring actual brightness by exhaustively enumerating all gray scales in an available gray scale range at a preset gray scale interval as a gray scale M of a previous frame, and exhaustively enumerating all the gray scales in the available gray scale range at the preset gray scale interval as a target gray scale N of a current frame, and correspondingly recording all actual brightness values in the overdrive brightness value look-up table.


Find Patent Forward Citations

Chen, Wei. (2023). Methods for debugging and using overdrive brightness value look-up table, and display panel (U.S. Patent No. 11645991). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11645991

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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