The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 09, 2023
Filed:
Jun. 30, 2016
Nikon Corporation, Tokyo, JP;
The University of Tokyo, Tokyo, JP;
Takuro Saigo, Tokyo, JP;
Shinichi Furuta, Yokohama, JP;
Shunsuke Takei, Yokohama, JP;
Masafumi Yamashita, Fujisawa, JP;
Shoko Yamasaki, Tokyo, JP;
Masayuki Murata, Tokyo, JP;
Fumi Kano, Tokyo, JP;
Yoshiyuki Noguchi, Tokyo, JP;
NIKON CORPORATION, Tokyo, JP;
THE UNIVERSITY OF TOKYO, Tokyo, JP;
Abstract
An analysis device configured to analyze a correlation between feature values in a cell in response to a stimulus includes: a cell-image acquiring unit configured to acquire a plurality of cell images in which the cell that is stimulated is captured; a feature value calculating unit configured to calculate a feature value for constituent elements that form the cell, based on the plurality of cell images acquired by the cell-image acquiring unit; a correlation calculating unit configured to use the feature value calculated by the feature value calculating unit and to calculate correlations between the constituent elements; a correlation selecting unit configured to select a first correlation from the correlations calculated by the correlation calculating unit; and an image selecting unit configured to select a first cell image from the plurality of cell images that are captured, based on the first correlation that is selected.