The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 09, 2023

Filed:

Aug. 14, 2020
Applicant:

Meta Platforms Technologies, Llc, Menlo Park, CA (US);

Inventors:

Anjul Patney, Kirkland, WA (US);

Anton S. Kaplanyan, Redmond, WA (US);

Todd Goodall, Mill Valley, CA (US);

Assignee:

Meta Platforms Technologies, LLC, Menlo Park, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 9/00 (2006.01); G06T 7/215 (2017.01); G06T 7/90 (2017.01); G06N 20/00 (2019.01); G06F 17/18 (2006.01); G06T 3/40 (2006.01);
U.S. Cl.
CPC ...
G06T 7/215 (2017.01); G06F 17/18 (2013.01); G06N 20/00 (2019.01); G06T 3/4023 (2013.01); G06T 7/90 (2017.01); G06T 9/002 (2013.01);
Abstract

In one embodiment, a method includes determining characteristics of one or more areas in an image by analyzing pixels in the image, computing a sampling density for each of the one or more areas in the image based on the characteristics of the one or more areas, generating samples corresponding to the image by sampling pixels in each of the one or more areas according to the associated sampling density, and providing the samples to a machine-learning model as an input, where the machine-learning model is configured to reconstruct the image by processing the samples.


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