The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 09, 2023
Filed:
Dec. 06, 2016
Mitsubishi Electric Corporation, Tokyo, JP;
Kazuyuki Miyazawa, Tokyo, JP;
Mitsubishi Electric Corporation, Tokyo, JP;
Abstract
An inspection device includes: an analyzer to calculate a parameter representing a feature of image data of an object having no defect by performing dimensionality reduction on the image data, and perform dimensionality reduction on image data of an object to be inspected by using the parameter; a restorer to generate restored data obtained by restoring the image data of the object to be inspected subjected to the dimensionality reduction; a corrector to filter the restored data by using a filter for correcting an error between the restored data and the image data of the object to be inspected, thereby generating corrected restored data; a determiner to output a determination result indicating whether the object to be inspected is defective, based on a difference of each pixel between the image data of the object to be inspected and the corrected restored data; and an interface to output the determination result.