The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 09, 2023

Filed:

Mar. 29, 2019
Applicant:

Nec Corporation, Tokyo, JP;

Inventor:

Ayako Hoshino, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 40/137 (2020.01); G06F 40/166 (2020.01);
U.S. Cl.
CPC ...
G06F 40/137 (2020.01); G06F 40/166 (2020.01);
Abstract

A document analysis apparatusincludes: a candidate generation unitthat, for each line included in a document that is a target of structural analysis, specifies another line in a parallel relationship with the line by performing extraction of a marker indicating a hierarchy, and generates a candidate for a hierarchical structure of the document that is the target based on the result of the specification of each line; and a candidate evaluation unitthat, if two or more candidates have been generated, performs evaluation on each candidate for the hierarchical structure, and selects one candidate for the hierarchical structure as the hierarchical structure of the document that is the target based on the evaluation result.


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Hoshino, Ayako. (2023). Document analysis apparatus, document analysis method, and computer-readable recording medium (U.S. Patent No. 11645448). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11645448

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