The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 09, 2023

Filed:

Oct. 07, 2022
Applicant:

Sas Institute Inc., Cary, NC (US);

Inventors:

Wei Xu, Beijing, CN;

Robert William Pratt, Apex, NC (US);

Natalia Summerville, Cary, NC (US);

Assignee:

SAS Institute Inc., Cary, NC (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/18 (2006.01);
U.S. Cl.
CPC ...
G06F 17/18 (2013.01);
Abstract

A computing device selects a piecewise linear regression model for multivariable data. A hyperplane is fit to observation vectors using a linear multivariable regression. A baseline fit quality measure is computed for the fit hyperplane. For each independent variable, the observation vectors are sorted, contiguous segments to evaluate are defined, for each contiguous segment, a segment hyperplane is fit to the sorted observation vectors using a multivariable linear regression, path distances are computed between a first observation of the and a last observation of the sorted observation vectors based on a predefined number of segments, a shortest path associated with a smallest value of the computed path distances is selected, and a fit quality measure is computed for the selected shortest path. A best independent variable is selected from the independent variables based on having an extremum value for the computed fit quality measure.


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