The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 09, 2023

Filed:

Jul. 03, 2019
Applicant:

Vmware, Inc., Palo Alto, CA (US);

Inventors:

Barak Raz, Palo Alto, CA (US);

Vamsi Akkineni, Los Gatos, CA (US);

Assignee:

VMWARE, INC., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 16/906 (2019.01); G06F 9/455 (2018.01);
U.S. Cl.
CPC ...
G06F 16/906 (2019.01); G06F 9/45558 (2013.01);
Abstract

Certain aspects of the present disclosure relate to methods and systems for evaluating a first command line interface (CLI) input of a process. The method comprises examining the first CLI input and selecting a first clustering model corresponding to the process, wherein the first clustering model is created based on a first clustering configuration and a first feature type combination. The method further comprises creating a first feature combination for the first CLI input based on the first feature type combination, evaluating the first CLI input using the first clustering model and the first feature combination, wherein the evaluating further comprises determining a similarity score corresponding to a similarity between the first feature combination and the one or more clusters, and determining whether or not the first CLI input corresponds to normal behavior based on the similarity score.


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