The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 09, 2023

Filed:

Dec. 10, 2019
Applicant:

Exfo Solutions Sas, Saint-Jacques-de-la-Lande, FR;

Inventor:

Fabrice Pelloin, Rennes, FR;

Assignee:

EXFO SOLUTIONS SAS, Rennes, FR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 16/25 (2019.01); G06F 16/2458 (2019.01); G06N 20/00 (2019.01); G06F 17/14 (2006.01); G06F 16/23 (2019.01); G06F 16/182 (2019.01); G06N 5/04 (2023.01);
U.S. Cl.
CPC ...
G06F 16/2477 (2019.01); G06F 16/182 (2019.01); G06F 16/2379 (2019.01); G06F 16/2474 (2019.01); G06F 16/252 (2019.01); G06F 17/142 (2013.01); G06N 5/04 (2013.01); G06N 20/00 (2019.01);
Abstract

An example embodiment may involve obtaining training time series data spanning an observation time window and comprising a series of values of a metric at regularly-spaced sample points in time, and analyzing the training time series data to determine one of a periodicity or a pseudo-periodicity across a plurality of consecutive sub-windows, each equal in size to a reference time period and each spanned by the same number N of sample points of metric values. A reference pattern corresponding to a model time series having no anomalies, as well as a reference threshold, may be determined and stored. Runtime time series data may then be obtained and time aligned with the reference pattern. Deviations between the runtime time series and the reference pattern may be identified as anomalies if they exceed the reference threshold. Identified anomalies may be displayed in a display device.


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