The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 09, 2023
Filed:
Aug. 15, 2019
Endress+hauser Se+co. KG, Maulburg, DE;
Manfred Niederer, Sonthofen, DE;
Stefan Robl, Hünxe, DE;
Ervin Binkert, Möhlin, CH;
Alexey Malinovskiy, Maulburg, DE;
Heiko Oehme, Jena, DE;
Zurab Khadikov, Bad Krozingen, DE;
Ulrich Kaiser, Basel, CH;
Endress+Hauser Conducta GmbH+Co. KG, Maulburg, DE;
Abstract
Disclosed is a method for improving the measuring performance of automation field devices, wherein each of the field devices determines a process variable using a measuring algorithm and is exposed to measurable environmental influences. The method includes capturing the calibration data of the field devices and capturing an item of environmental information of the field devices at defined time intervals; storing the environmental information, the calibration data, and a time stamp in a database; selecting a group of field devices which determine a process variable using the same measuring algorithm and which are exposed to the same environmental influences; correlating the environmental information and calibration data captured over time; creating a mathematical model relating the calibration data and the environmental information; adapting the measuring algorithm on the basis of the model; and transmitting the adapted measuring algorithm to all field devices in the group.