The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 09, 2023

Filed:

Apr. 28, 2021
Applicants:

Kabushiki Kaisha Toshiba, Tokyo, JP;

Toshiba Digital Solutions Corporation, Kawasaki, JP;

Inventors:

Shintarou Takahashi, Kawasaki, JP;

Minoru Nishizawa, Itabashi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 23/02 (2006.01); G05B 19/418 (2006.01); G06N 3/04 (2023.01);
U.S. Cl.
CPC ...
G05B 23/0221 (2013.01); G05B 19/4183 (2013.01); G05B 23/024 (2013.01); G05B 23/0254 (2013.01); G06N 3/04 (2013.01);
Abstract

A product state estimation device includes: an examination result acquisition device that acquires an examination result related to a state of a product obtained through each shot by a die-casting machine; a time series data acquisition device that acquires time series data based on an output from a sensor that detects an operation state of the die-casting machine at each shot; a time series data manipulation device that performs manipulation that clips data of a predetermined time interval out of the time series data; an estimation model generation device that generates an estimation model by using a neural network with the examination result of the product and the manipulated time series data as learning data; and an estimation device that estimates information related to quality of the product based on the manipulated time series data obtained from a plurality of detection signals at each shot by using the estimation model.


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