The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 09, 2023

Filed:

Oct. 12, 2018
Applicant:

Hitachi High-tech Corporation, Tokyo, JP;

Inventors:

Takashi Anazawa, Tokyo, JP;

Ryoji Inaba, Tokyo, JP;

Shuhei Yamamoto, Tokyo, JP;

Taro Nakazawa, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 27/14 (2006.01); G01N 21/64 (2006.01);
U.S. Cl.
CPC ...
G02B 27/141 (2013.01); G01N 21/6402 (2013.01); G01N 21/6486 (2013.01); G01N 2021/6439 (2013.01); G01N 2021/6463 (2013.01);
Abstract

In a right-handed XYZ coordinate system, a dichroic-mirror array of the present disclosure includes a first group in which m (m≥2) dichroic mirrors DAto DAm are arranged parallel to each other along a positive direction of an X axis and a second group in which n (n≥2) dichroic mirrors DBto DBn are arranged parallel to each other along a negative direction of the X axis. Incident surfaces of the DAto DAm and incident surfaces of the DBto DBn are perpendicular to an XZ plane. A slope of straight lines with normal lines of the incident surfaces of the DAto DAm projected onto the XZ plane are negative, and a slope of straight lines with normal lines of incident surfaces of DBto DBn projected onto the XZ plane are positive.


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