The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 09, 2023

Filed:

Jun. 17, 2022
Applicant:

Aptiv Technologies Limited, St. Michael, BB;

Inventors:

Jens Westerhoff, Bochum, DE;

Wolfgang Doerr, Wiehl, DE;

Assignee:

Aptiv Technologies Limited, St. Michael, BB;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 17/36 (2006.01); G01S 17/931 (2020.01);
U.S. Cl.
CPC ...
G01S 17/36 (2013.01); G01S 17/931 (2020.01);
Abstract

The present disclosure describes systems and techniques for estimating a height of an object by processing wave signals transmitted from a detection device to the object and reflected by the object. In aspects, a detection device transmits wave signals, which propagate via a direct path and an indirect path via reflection over a reflecting surface, to be reflected by the object. Operations include measuring wave signals reflected by the object and generating measurement vectors and producing a spectrum of an estimated elevation angle of the object over the range. Further, the operations include estimating the height of the object from the spectrum. The length of the window can be determined by estimating the range interval covered by a full phase cycle of a phase difference between the direct path and the indirect path from a current value of the range and a current estimate of the height of the object.


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