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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 11644556 B1

PDFFull Text
Date of Patent:
May. 09, 2023

Filed:

Jun. 18, 2018

Position measurement device, position measurement method, and program recording medium

Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Kazumine Ogura, Tokyo, JP;

Shingo Yamanouchi, Tokyo, JP;

Masayuki Ariyoshi, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:

Sughrue Mion, PLLC

Primary Examiner:

Bernarr E Gregory

Assistant Examiner:

Michael W Justice

Int. Cl.
CPC ...
G01S 13/08 (2006.01); G01S 13/04 (2006.01);
U.S. Cl.
CPC ...
G01S 13/08 (2013.01); G01S 13/04 (2013.01);
Abstract

A position measurement device which includes: a storage unit that stores area information for setting a first region along a boundary of the specific area; an area setting unit that acquires the area information from the storage unit and sets the first region on the basis of the acquired area information; and a position measurement unit that acquires the first region from the area setting unit, sets the acquired first region as a verification region, measures the position of the object located in the verification region, and updates the area information stored in the storage unit.

Find Patent Forward Citations

Ogura, Kazumine. (2023). Position measurement device, position measurement method, and program recording medium (U.S. Patent No. 11644556). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11644556

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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