The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 09, 2023

Filed:

Jun. 12, 2020
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventor:

Lilong Shi, Pasadena, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 7/487 (2006.01); G01S 7/48 (2006.01); G01S 17/10 (2020.01); G01S 7/4861 (2020.01);
U.S. Cl.
CPC ...
G01S 7/4873 (2013.01); G01S 7/4808 (2013.01); G01S 17/10 (2013.01); G01S 7/4861 (2013.01);
Abstract

A system and method for detecting a peak bin from among a plurality of bins in a window. In some embodiments, each of the bins has a lower limit and an upper limit and contains zero or more values. The method may include: identifying a first bin, from among a plurality of bins in a first subwindow of the window, the first bin containing n values, n being a positive integer, n being greater than or equal to the number of values in each of the other bins in the first subwindow; calculating a first height-to-area ratio, the first height-to-area ratio being equal to n divided by the number of values in the first subwindow; and comparing the first height-to-area ratio to a first threshold.


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