The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 09, 2023

Filed:

Aug. 16, 2021
Applicant:

Lumotive, Inc., Redmond, WA (US);

Inventors:

Gleb M. Akselrod, Kenmore, WA (US);

Prasad Padmanabha Iyer, Albuquerque, NM (US);

Ross D. Uthoff, Seattle, WA (US);

Assignee:

Other;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01S 7/481 (2006.01); G01S 7/484 (2006.01); G02F 1/29 (2006.01); G01S 7/486 (2020.01); G01S 17/88 (2006.01); G02B 1/00 (2006.01);
U.S. Cl.
CPC ...
G01S 7/486 (2013.01); G01S 7/484 (2013.01); G01S 7/4817 (2013.01); G02F 1/292 (2013.01); G01S 17/88 (2013.01); G02B 1/002 (2013.01);
Abstract

An example optical transceiver system, such as a solid-state light detection and ranging (lidar) system, includes a tunable, optically reflective metasurface to selectively reflect incident optical radiation as transmit scan lines at transmit steering angles between a first steering angle and a second steering angle. In some embodiments, a feedback element, such as a volume Bragg grating element, may lock a laser to narrow the band of optical radiation. A receiver may include a tunable, optically reflective metasurface for receiver line-scanning or a two-dimensional array of detector elements forming a set of discrete receive scan lines. In embodiments incorporating a two-dimensional array of detector elements, receiver optics may direct optical radiation incident at each of a plurality of discrete receive steering angles to a unique subset of the discrete receive scan lines of detector elements.


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