The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 09, 2023

Filed:

Jun. 12, 2017
Applicant:

Hitachi High-tech Corporation, Tokyo, JP;

Inventors:

Akira Maekawa, Tokyo, JP;

Shinya Ito, Tokyo, JP;

Hiromichi Yamashita, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 30/72 (2006.01); G01N 30/86 (2006.01);
U.S. Cl.
CPC ...
G01N 30/72 (2013.01); G01N 30/8631 (2013.01); G01N 30/8668 (2013.01);
Abstract

A chromatography-mass spectrometry method and apparatus of the present invention includes adding, to a sample, an internal standard material having a retention time similar to that of a target analyte and having a mass-to-charge ratio different from that of the target analyte; measuring the sample with a chromatograph-mass spectrometer and obtaining a chromatogramof the target analyte and a chromatogramof the internal standard material; detecting a peakfrom the chromatogram of the internal standard material and obtaining a peak start time and a peak end time of the peak; and applying the obtained peak start time and peak end time to a peak start time and a peak end time of the chromatogram of the target analyte.


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