The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 09, 2023
Filed:
Oct. 19, 2021
The Boeing Company, Chicago, IL (US);
Hong Hue Tat, Redmond, WA (US);
Yuan-Jye Jason Wu, Issaquah, WA (US);
Anuj K. Adhikaram, Shoreline, WA (US);
Christopher R. Loesche, Bothell, WA (US);
The Boeing Company, Arlington, VA (US);
Abstract
A method for quantitatively evaluating the expected ultrasonic inspectability of a designed part using ray tracing. First, a model of a part imported. Materials having different indices of refraction are selected for the part and an acoustic coupling medium. Then the following structures and positional relationships are defined: an ultrasonic transducer array comprising a plurality of elements, a position of the acoustic coupling medium between the transducer array and the part, and a plurality of positions of a transmit aperture relative to the part. For each defined position of the transmit aperture, a path of a respective ray is traced from a center of the transmit aperture through the part and then to a respective receive location on the transducer array. Also, a respective value of an inspectability margin is calculated based at least in part on a respective distance between a center of the receive aperture and the respective receive location. Each value of the inspectability margin is compared to a threshold value.