The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 09, 2023

Filed:

Jan. 24, 2020
Applicant:

Tohoku University, Sendai Miyagi, JP;

Inventor:

Atsushi Momose, Sendai, JP;

Assignee:

Tohoku University, Sendai-shi, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 23/041 (2018.01); G01T 7/00 (2006.01);
U.S. Cl.
CPC ...
G01N 23/041 (2018.02); G01T 7/00 (2013.01);
Abstract

A high-sensitive phase imaging is achieved using a grating section without upsizing the imaging device or narrowing the period of the gratings. A radiation source generates radiation on a radiation path toward the grating section. The grating section comprises a G1 grating and a refraction-enhancing grating. The G1 grating has a G1 periodic structure that forms radiation converging points where an intensity of the radiation is increased between the G1 grating and a detector. The refraction-enhancing grating is located at the position of the radiation converging points and has enhancement planes and that increase the refraction angle of the radiation. The detector detects the radiation that has passed through the grating section.


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