The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 09, 2023
Filed:
May. 07, 2021
Exfo Optics, Sas, Lannion, FR;
Normand Cyr, Quebec, CA;
Bernard Ruchet, Quebec, CA;
EXFO Optics, SAS, Lannion, FR;
Abstract
There is provided a method for measuring the PDL of a DUT as a function of the optical frequency ν within a spectral range, which uses a single wavelength scan over which the input-SOP varies in a continuous manner. The power transmission through the DUT, curve T(ν), is measured during the scan and the PDL is derived from the sideband components of the power transmission curve T(ν) that results from the continuously varying input-SOP. More specifically, the Discrete Fourier Transform (DFT) of the power transmission curve T(ν) is calculated, wherein the DFT shows at least two sidebands. At least two sidebands are extracted and their inverse DFT calculated individually to obtain complex transmissions(ν),=−J . . . J, where J is the number of sidebands on one side. The response vector |m(ν)of the DUT is derived from the complex transmissions(ν) and a matrixdetermined by the continuous trajectory of the SOP of the input test lightwave; and the PDL of the DUT as a function of ν (PDL curve) is derived therefrom.