The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 09, 2023

Filed:

Feb. 02, 2021
Applicant:

Dr. Johannes Heidenhain Gmbh, Traunreut, DE;

Inventors:

Thomas Kaelberer, Schrobenhausen, DE;

Wolfgang Holzapfel, Obing, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01D 5/38 (2006.01); G01B 11/00 (2006.01); G01D 5/347 (2006.01);
U.S. Cl.
CPC ...
G01D 5/38 (2013.01); G01B 11/00 (2013.01); G01B 11/005 (2013.01); G01D 5/34715 (2013.01); G01D 5/34746 (2013.01);
Abstract

An optical position measuring device for recording a relative position of two scales includes the scales. The longitudinal extents of the scales are oriented parallel to a first and second measuring direction. A horizontal plane of movement is spanned by these measuring directions. A light source is configured to emit an illumination beam that is split into at least two sub-beam bundles at the first scale. The sub-beam bundles subsequently impinge on the second scale, which is tilted about the direction of the longitudinal extent thereof relative to the horizontal plane of movement, and are back-reflected to impinge again on the first scale and are recombined there such that a resulting signal beam is subsequently propagated toward a detection unit, via which phase-shifted scanning signals are generatable with respect to a relative movement of the scales along a third perpendicular measuring direction and the first or second measuring direction.


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