The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 09, 2023
Filed:
Sep. 18, 2020
Applicant:
Faro Technologies, Inc., Lake Mary, FL (US);
Inventor:
Rolf Heidemann, Stuttgart, DE;
Assignee:
FARO Technologies, Inc., Lake Mary, FL (US);
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/00 (2006.01); H04N 5/225 (2006.01); G06T 7/70 (2017.01);
U.S. Cl.
CPC ...
G01B 11/005 (2013.01); G06T 7/70 (2017.01); H04N 5/2253 (2013.01); H04N 5/2254 (2013.01); G06T 2207/30204 (2013.01); G06T 2207/30244 (2013.01);
Abstract
A method including determining with a three-dimensional (3D) measuring instrument 3D coordinates of an object for each of a plurality of poses of the 3D measuring instrument; capturing with a camera first- and higher-order diffraction components of markers near or on the object, the camera having a diffractive optical element (DOE), a lens, and a photosensitive array; and registering with a processor the determined 3D coordinates based at least in part on the determined 3D coordinates and on the imaged zero- and higher-order diffraction components.