The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 09, 2023
Filed:
Jan. 29, 2021
Autodesk, Inc., San Francisco, CA (US);
Marco Adriano, Sutton Coldfield, GB;
Lee Sanders, Tamworth, GB;
Richard Matthew Stubley, Hayley Green, GB;
Autodesk, Inc., San Francisco, CA (US);
Abstract
Methods, systems, and apparatus, including medium-encoded computer program products, for automatic generation of probe path for surface inspection and part alignment. A mesh model is obtained of at least a portion of a three dimensional model of a part to be manufactured using a computer-controlled manufacturing system. Vertex points from the mesh model are collected to be an initial set of probing points in a three dimensional space of a working coordinate system of the computer-controlled manufacturing system, and filtering out points are filtered out from the initial set of probing points based on coverage of the least a portion of the three dimensional model to produce a final set of probing points. The final set of probing points is provided for use in alignment or surface inspection of the part by the computer-controlled manufacturing system.