The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 09, 2023

Filed:

Dec. 11, 2019
Applicant:

Bp Exploration Operating Company Limited, Middlesex, GB;

Inventor:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
E21B 47/107 (2012.01); G01V 1/28 (2006.01); G01V 1/22 (2006.01); G01V 13/00 (2006.01);
U.S. Cl.
CPC ...
E21B 47/107 (2020.05); G01V 1/226 (2013.01); G01V 1/288 (2013.01); G01V 13/00 (2013.01); G01V 2210/43 (2013.01); G01V 2210/6161 (2013.01);
Abstract

A method of detecting an event by: obtaining a first sample data set; determining a frequency domain feature(s) of the first sample data set over a first time period; determining a first threshold for the a frequency domain feature(s) using the first sample data set; determining that the frequency domain feature(s) matches the first threshold; determining the presence of an event during the first time period based on determining that the frequency domain feature(s) matches the first threshold; obtaining a second sample data set; determining a frequency domain feature(s) of the second sample data set over a second time period; determining a second threshold for the frequency domain feature(s) using the second sample data set; determining that the frequency domain feature(s) matches the second threshold; and determining the presence of the event during the second time period based on determining that the frequency domain feature(s) matches the second threshold.


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