The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 09, 2023

Filed:

Mar. 28, 2018
Applicant:

Sekisui Chemical Co., Ltd., Osaka, JP;

Inventors:

Jun Ishida, Kouka, JP;

Hiromitsu Nishino, Kouka, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B32B 17/10 (2006.01); B32B 27/08 (2006.01); B32B 27/22 (2006.01); B32B 27/30 (2006.01); B32B 3/26 (2006.01); C08L 29/14 (2006.01); C08J 5/18 (2006.01);
U.S. Cl.
CPC ...
B32B 17/10568 (2013.01); B32B 3/26 (2013.01); B32B 17/10036 (2013.01); B32B 17/10761 (2013.01); B32B 27/08 (2013.01); B32B 27/22 (2013.01); B32B 27/30 (2013.01); C08J 5/18 (2013.01); C08L 29/14 (2013.01); B32B 2307/40 (2013.01); B32B 2315/08 (2013.01); B32B 2329/06 (2013.01); B32B 2457/20 (2013.01); B32B 2605/006 (2013.01); C08J 2329/14 (2013.01);
Abstract

Provided is an interlayer film for laminated glass capable of reducing the variation in double images in laminated glass in the direction perpendicular to the direction connecting one end and the other end of the interlayer film, and effectively suppressing double images. An interlayer film for laminated glass according to the present invention has one end and the other end being at the opposite side of the the one end, the other end has a thickness of larger than a thickness of the one end, the interlayer film for laminated glass as a whole has a wedge angle of 0.1 mrad or more, and the interlayer film for laminated glass has a thickness varying region in a region extending in the direction perpendicular to the direction connecting the one end and the other end of the interlayer film, having a standard deviation of 11 partial wedge angles measured by the following measuring method of 0.040 mrad or less.


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