The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 02, 2023

Filed:

Aug. 10, 2020
Applicant:

Postech Research and Business Development Foundation, Pohang-si, KR;

Inventors:

Hojin Song, Pohang-si, KR;

Seunghoon Lee, Daegu, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 17/15 (2015.01); H04B 17/11 (2015.01); H04B 17/00 (2015.01);
U.S. Cl.
CPC ...
H04B 17/15 (2015.01); H04B 17/0085 (2013.01); H04B 17/11 (2015.01);
Abstract

A measuring device may include: a signal generator for generating a test signal; and a measurement control unit that inputs the generated test signal to a radio frequency (RF) chain including at least one circuit element, detects output signals of a first diode, a second diode, and a third diode which receive, as input signals, signals generated on the basis of a coupled signal for an input test signal of a circuit element of the at least one circuit element and a coupled signal for an output test signal of the circuit element, and measures an S-parameter for the circuit element on the basis of a component signal of the third frequency in the output signal of the first diode, a component signal of the third frequency in the output signal of the third diode, and the output signal of the second diode.


Find Patent Forward Citations

Song, Hojin. (2023). Method and device for measuring characteristics of rf chains (U.S. Patent No. 11641243). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11641243

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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