The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 02, 2023
Filed:
Jan. 25, 2021
Applicant:
Biomerieux, Inc., Durham, NC (US);
Inventor:
James Arthur VanGordon, O'Fallon, MO (US);
Assignee:
bioMeriuex, Inc, Durham, NC (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/02 (2006.01); H01J 49/26 (2006.01); H01J 49/16 (2006.01); H01J 49/40 (2006.01); H01J 37/244 (2006.01); H01J 49/04 (2006.01); H01J 49/06 (2006.01); H01J 49/00 (2006.01);
U.S. Cl.
CPC ...
H01J 49/164 (2013.01); H01J 37/244 (2013.01); H01J 49/0027 (2013.01); H01J 49/025 (2013.01); H01J 49/027 (2013.01); H01J 49/0418 (2013.01); H01J 49/06 (2013.01); H01J 49/403 (2013.01);
Abstract
Methods for confirming charged-particle generation in an instrument are provided. A method to confirm charged-particle generation in an instrument includes providing electrical connections to a charged-particle optics system of the instrument while the charged-particle optics system is in a chamber. The method includes coupling an electrical component having an impedance to charged-particle current generated in the chamber. Moreover, the method includes measuring an electrical response by the electrical component to the charged-particle current. Related instruments are also provided.