The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 02, 2023
Filed:
Nov. 09, 2020
Applicant:
Leidos Security Detection & Automation, Inc., Tewksbury, MA (US);
Inventors:
David Perticone, Winchester, MA (US);
Andrew D. Foland, Wellesley, MA (US);
Assignee:
Leidos Security Detection & Automation, Inc., Tewksbury, MA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2022.01); G06T 7/00 (2017.01); G06N 3/08 (2023.01); G16H 30/20 (2018.01); G06K 9/62 (2022.01); G06T 7/73 (2017.01); G08B 13/189 (2006.01); G06V 20/00 (2022.01);
U.S. Cl.
CPC ...
G06T 7/0002 (2013.01); G06K 9/6256 (2013.01); G06N 3/08 (2013.01); G06T 7/73 (2017.01); G06V 20/00 (2022.01); G08B 13/189 (2013.01); G16H 30/20 (2018.01); G06T 2207/10116 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/30112 (2013.01); G06V 2201/05 (2022.01);
Abstract
A computing-device implemented system and method for identifying an item in an x-ray image is described. The method includes training a machine learning algorithm with at least one training data set of x-ray images to generate at least one machine-learned model. The method further includes receiving at least one rendered x-ray image that includes an item, identifying the item using the at least one model, and generating an automated detection indication associated with the item.