The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 02, 2023

Filed:

Jan. 14, 2021
Applicant:

General Electric Company, Schenectady, NY (US);

Inventors:

S V Raj Kumar Bolisetti, Bangalore, IN;

Rajani M. Poornima, Bangalore, IN;

Ashok Kumaraswamy, Bangalore, IN;

Vishnu Tatiparthi, Bangalore, IN;

Lakshmy Narayanan, Bangalore, IN;

Vamshi Krishna Reddy Kommareddy, Bangalore, IN;

Aditya Bhakta, Bangalore, IN;

Raja Vardhan Movva, Bangalore, IN;

Debasish Mishra, Bangalore, IN;

Assignee:

General Electric Company, Schenectady, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2022.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G06T 7/001 (2013.01); G06T 2207/10016 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/30164 (2013.01);
Abstract

There are provided methods and systems for assessing the health of an asset. For example, a system is provided. The system may include a processor and a memory including instructions that, when executed by the processor, cause the processor to perform operations consistent with identifying a defect in a component of an asset. The operations may include fetching from an inspection system, a plurality of images acquired from an inspection of the component of the asset by the inspection system. The operations may include identifying, based on an image processing technique codified and included as part of the instructions, a subset of images from the plurality of images. The subset of images is representative of the defect in the component of the asset, and the image processing technique is selected from the group consisting of an auto-distress ranking technique, a structural similarity technique, a mean-subtracted filtering technique, and a Hessian norm computation technique.


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