The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 02, 2023

Filed:

Aug. 14, 2018
Applicant:

Beijing Baidu Netcom Science and Technology Co., Ltd., Beijing, CN;

Inventors:

Tian Wu, Beijing, CN;

Wensong He, Beijing, CN;

Lei Han, Beijing, CN;

Xiao Zhou, Beijing, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06N 20/00 (2019.01); G06F 17/18 (2006.01); G06F 18/2413 (2023.01); G06F 18/21 (2023.01); G06F 18/2411 (2023.01); G06F 18/214 (2023.01);
U.S. Cl.
CPC ...
G06N 20/00 (2019.01); G06F 17/18 (2013.01); G06F 18/2178 (2023.01); G06F 18/2411 (2023.01); G06F 18/2413 (2023.01); G06F 18/2155 (2023.01);
Abstract

The present disclosure proposes a method and an apparatus for recommending sample data. The method may include: inputting a plurality of pieces of sample data to be classified into at least one preset classification model, and acquiring a classifying probability of classifying each piece of sample data into each classification model; acquiring a first distance between each piece of sample data and a classifying boundary of each classification model according to the classifying probability of classifying the piece of sample data into the classification model, in which the classifying boundary of the classification model is configured to distinguish positive and negative sample data; computing a target distance for each piece of sample data according to the first distance between each piece of sample data and the classifying boundary of each classification model.


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