The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 02, 2023

Filed:

Apr. 30, 2021
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Xiang Yu Yang, Xian, CN;

Deng Xin Luo, Xian, CN;

Ye Wang, Xian, CN;

Yu Pan, Shanghai, CN;

Zhong Fang Yuan, Xian, CN;

Miao Guo, Beijing, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/23 (2019.01); G06F 16/28 (2019.01); G06F 16/90 (2019.01); G06F 16/24 (2019.01); G06F 16/901 (2019.01); G06F 18/2433 (2023.01); G06F 18/2413 (2023.01);
U.S. Cl.
CPC ...
G06F 16/2365 (2019.01); G06F 16/288 (2019.01); G06F 16/9024 (2019.01); G06F 18/2433 (2023.01); G06F 18/24147 (2023.01);
Abstract

Methods, computer program products, and/or systems are provided that perform the following operations: obtaining pre-check data associated with specified data nodes; calculating outliers for each specified data node, wherein the outliers are calculated based on a unit of the pre-check data associated with each specified data node; backtracking the calculated outliers for each specified data node through an associated generating data link; selecting one or more data nodes associated with a set of largest outliers; selecting one or more data links associated with the set of largest outliers; and generating potential anomaly indications based on the one or more data nodes selected and the one or more data links selected.


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