The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 02, 2023
Filed:
Jul. 16, 2020
Dell Products, L.p., Round Rock, TX (US);
Cyril Jose, Austin, TX (US);
Choudary Maddukuri, Austin, TX (US);
Sankara Rao Gara, Cedar Park, TX (US);
Sankunny Jayaprasad, Round Rock, TX (US);
Sailaja Mahendrakar, Austin, TX (US);
Dell Products, L.P., Round Rock, TX (US);
Abstract
Systems and methods utilize telemetry data to provide administrators with metric information related to a detected IHS (Information Handling System) event, such as an error condition, where the provided metric information is particularized to the context of the event. A remote access controller (RAC) of the IHS stores metric reports received from metric sources. The RAC receives an indication of the event that specifies a first IHS component as a source of the event and specifies a time associated with the event. The RAC identifies stored metric reports generated by the first component prior to the first time and identifies stored metric reports generated by components that are logically and/o physically related to the first component. The RAC generates an event report that includes the metric reports generated by the first component prior to the first time and the metric reports generated by components related to the first component.