The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 02, 2023
Filed:
Sep. 24, 2021
Applicant:
Qualcomm Incorporated, San Diego, CA (US);
Inventors:
Kunal Desai, Bangalore, IN;
Ankit Shambhu, Bangalore, IN;
Srinivas Maddali, Bangalore, IN;
Sanjeev Shukla, Bristol, GB;
Assignee:
QUALCOMM Incorporated, San Diego, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 1/28 (2006.01); G06F 11/30 (2006.01); G06F 1/26 (2006.01); G06F 1/04 (2006.01); G06F 11/22 (2006.01); G06F 1/30 (2006.01);
U.S. Cl.
CPC ...
G06F 1/28 (2013.01); G06F 1/04 (2013.01); G06F 1/266 (2013.01); G06F 11/3058 (2013.01); G06F 1/30 (2013.01); G06F 1/305 (2013.01); G06F 11/22 (2013.01); G06F 11/2284 (2013.01);
Abstract
A system-on-a-chip ('SoC') in a computing device may be provided with a power delivery network ('PDN') self-test to detect marginal PDN performance. In the self-test, a current surge may be generated on power supply connections of logic circuit blocks. Voltage monitors may measure voltage droop on the power supply connections responsive to the current surge. Voltage droop measurements may be compared with thresholds. An action, such as generation of an alert, may be performed if a voltage droop measurement exceeds a threshold.