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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 11640054 B1

PDFFull Text
Date of Patent:
May. 02, 2023

Filed:

Mar. 19, 2021

Multi-wavelength self-mixing interferometry

Applicant:

Meta Platforms Technologies, Llc, Menlo Park, CA (US);

Inventors:

Maik Andre Scheller, Redmond, WA (US);

Liliana Ruiz Diaz, Redmond, WA (US);

Marc Aurele Gilles, Redmond, WA (US);

Andrew John Ouderkirk, Redmond, WA (US);

Robert Dale Cavin, Seattle, WA (US);

Assignee:

Meta Platforms Technologies, LLC, Menlo Park, CA (US);

Attorneys:

Freestone Intellectual Property Law PLLC

Aaron J. Visbeek

Primary Examiner:

Alexander Eisen

Assistant Examiner:

Kebede T Teshome

Int. Cl.
CPC ...
G02B 27/00 (2006.01); G01B 9/02 (2022.01); G02B 27/01 (2006.01); H04N 5/33 (2006.01);
U.S. Cl.
CPC ...
G02B 27/0093 (2013.01); G01B 9/02092 (2013.01); G02B 27/0172 (2013.01); H04N 5/33 (2013.01); G02B 2027/0138 (2013.01); G02B 2027/0178 (2013.01);
Abstract

An eyebox region is illuminated with first coherent light and second coherent light having a different wavelength than the first coherent light. A first self-mixed interferometer (SMI) signal is generated in response to first feedback light received back from the eyebox region. A second SMI signal is generated in response to second feedback light received back from the eyebox region. Eye data is generated in response to at least the first SMI signal and the second SMI signal.

Find Patent Forward Citations

Scheller, Maik. (2023). Multi-wavelength self-mixing interferometry (U.S. Patent No. 11640054). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11640054

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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