The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 02, 2023

Filed:

Jun. 21, 2019
Applicant:

Siemens Healthcare Gmbh, Erlangen, DE;

Inventors:

Gregor Koerzdoerfer, Erlangen, DE;

Mathias Nittka, Baiersdorf, DE;

Jianing Pang, Chicago, IL (US);

Peter Speier, Erlangen, DE;

Assignee:

Siemens Healthcare GmbH, Erlangen, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/48 (2006.01); G01R 33/56 (2006.01); G01R 33/50 (2006.01);
U.S. Cl.
CPC ...
G01R 33/4828 (2013.01); G01R 33/50 (2013.01); G01R 33/5608 (2013.01);
Abstract

In a method and apparatus for determining parameter values in voxels of an examination object using magnetic resonance fingerprinting (MRF), a first signal comparison is made of signal characteristics of established voxel time series with first comparison signal characteristics. Further synthetic comparison signal characteristics are generated from the first comparison signal characteristics and values determined in the first signal comparison. The generated further comparison signal characteristics are used to perform a further signal comparison, with which values of at least a first and a second further parameter are determined. From the further comparison signal characteristics, a value of at least one further parameter is determined that could not necessarily already be determined in the first signal comparison.


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