The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 02, 2023

Filed:

Mar. 21, 2022
Applicant:

Nearfield Atomics, Inc., Seattle, WA (US);

Inventor:

John Butters, Seattle, WA (US);

Assignee:

NEARFIFLD ATOMICS, INC., Seattle, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/26 (2006.01); G01R 33/032 (2006.01);
U.S. Cl.
CPC ...
G01R 33/26 (2013.01); G01R 33/032 (2013.01);
Abstract

Time-multiplexed atomic magnetometry uses first and second atomic vapor cells to measure an external magnetic field. Each vapor cell operates according to a sequence of alternating pumping and probing stages. However, the sequences are temporally offset from each other such that the second vapor cell is pumped while the first vapor cell is probed, and the first vapor cell is pumped while the second vapor cell is probed. With this time-multiplexed operation, the external magnetic field can be measured without any time gaps. The Hilbert transform of the signals may be taken to obtain their instantaneous phases, which may then be interleaved to form a single gapless time sequence that represents the external magnetic field over a time window that lasts for several continuous pumping/probing stages.


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