The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 02, 2023

Filed:

Mar. 29, 2018
Applicant:

Rohde & Schwarz Gmbh & Co. KG, Munich, DE;

Inventor:

Markus Freidhof, Kirchseeon, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/00 (2006.01); G01R 31/319 (2006.01); G01R 31/28 (2006.01); G01R 31/40 (2020.01); G01R 31/30 (2006.01); G01R 13/02 (2006.01); G01R 31/317 (2006.01);
U.S. Cl.
CPC ...
G01R 31/31903 (2013.01); G01R 31/2879 (2013.01); G01R 31/30 (2013.01); G01R 31/40 (2013.01); G01R 13/02 (2013.01); G01R 13/0254 (2013.01); G01R 31/2839 (2013.01); G01R 31/31721 (2013.01);
Abstract

A measurement device is described that comprises a measurement unit configured to perform measurements on an electric signal of a device under test while applying at least one measurement parameter for performing the measurements. The measurement device has an integrated direct current source configured to power the device under test. The measurement device also comprises a monitoring unit configured to monitor at least one monitoring parameter of the direct current source. The measurement device has a control unit configured to control the measurement parameter. Further, a method for measuring a device under test is described.


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