The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 02, 2023

Filed:

Mar. 10, 2020
Applicant:

Texas Instruments Incorporated, Dallas, TX (US);

Inventor:

Robert Gabriel Almendarez, Carrollton, TX (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/317 (2006.01); G01R 31/28 (2006.01); G01R 31/319 (2006.01);
U.S. Cl.
CPC ...
G01R 31/31718 (2013.01); G01R 31/2896 (2013.01);
Abstract

Apparatus for testing an integrated circuit is described, including a set of signal conductors for communicating signals to respective external conductors of the integrated circuit. The apparatus also includes a tester comprising circuitry for outputting a signal. An interposer is electrically coupled between the set of signal conductors and the tester. The interposer comprises circuitry for selecting a set of signals between the set of signal conductors and the tester and outputting the set of signals. A signal processing apparatus is coupled to receive the set of signals, and the signal processing apparatus is operable to evaluate a parameter associated with each signal in the set of signals.


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