The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 02, 2023
Filed:
Nov. 30, 2021
The Boeing Company, Chicago, IL (US);
William Paul Motzer, Mount Pleasant, SC (US);
Eddie Thelonious Boyd, Charleston, SC (US);
Sadie Lee Fieni, Glen Mills, PA (US);
David A. Lilienthal, Summerville, SC (US);
The Boeing Company, Arlington, VA (US);
Abstract
Non-destructive test systems and associated methods. A non-destructive test system includes an infrared thermography assembly and an ultrasonic test assembly for testing a test piece. The infrared thermography assembly may include one or more thermography sensor modules and a thermography test controller. The ultrasonic test assembly may include one or more ultrasonic sensor subassemblies with respective excitation modules and respective detector modules and an ultrasonic test controller. Each excitation module may be configured to produce a respective ultrasonic beam within the test piece, and each detector module may be configured to detect a respective reflected vibration of the test piece. In some examples, a method of performing a non-destructive test on a test piece includes testing an infrared test region of the test piece with an infrared thermography assembly and testing an ultrasonic test region of the test piece with an ultrasonic test assembly.