The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 02, 2023

Filed:

May. 17, 2021
Applicant:

Battelle Memorial Institute, Richland, WA (US);

Inventors:

Erin A. Miller, Richland, WA (US);

Richard E. Jacob, Kennewick, WA (US);

Nikhil S. Deshmukh, Everett, WA (US);

Cynthia L. Warner, Richland, WA (US);

Richard S. Wittman, Richland, WA (US);

Luke W. Campbell, Richland, WA (US);

Dustin M. Kasparek, Richland, WA (US);

Andy Gilbert, Richland, WA (US);

Stanley L. Owsley, Jr., Pasco, WA (US);

Kurt L. Silvers, Pasco, WA (US);

Mital A. Zalavadia, Richland, WA (US);

Assignee:

Battelle Memorial Institute, Richland, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/041 (2018.01); G01N 23/083 (2018.01); G01N 23/10 (2018.01); A61B 6/00 (2006.01); A61B 6/06 (2006.01); G01N 23/18 (2018.01);
U.S. Cl.
CPC ...
G01N 23/041 (2018.02); A61B 6/06 (2013.01); A61B 6/4035 (2013.01); A61B 6/4291 (2013.01); A61B 6/484 (2013.01); G01N 23/083 (2013.01); G01N 23/10 (2013.01); G01N 23/18 (2013.01); G01N 2223/316 (2013.01); G01N 2223/3307 (2013.01); G01N 2223/401 (2013.01); G01N 2223/424 (2013.01);
Abstract

Method include emitting x-rays from an x-ray source, directing a first portion of the x-rays through an object grating situated adjacent to an object while the object is scanned relative to the object grating along a scan direction, directing a second portion of the x-rays through the object and subsequently through a detector grating without transmitting through the object grating, wherein the object grating and detector grating are adjacently arranged in a field of view of the x-rays sequentially with respect to each other in the scan direction, and receiving the first portion transmitted through the object and object grating with a first portion of a detector and receiving the second portion transmitted through the object and the detector grating with a second portion of the detector adjacent to the first portion of the detector. Systems are also disclosed, along with related techniques for beam hardening correction.


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