The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 02, 2023
Filed:
Jan. 04, 2021
Diamontech Ag, Berlin, DE;
Werner Mäntele, Kiefersfelden-Mühlbach, DE;
Miguel Angel Pleitez Rafael, Frankfurt am Main, DE;
Tobias Lieblein, Frankfurt, DE;
Otto Hertzberg, Frankfurt am Main, DE;
Alexander Bauer, Oberursel, DE;
Hermann Von Lilienfeld-Toal, Gelnhausen, DE;
Arne Küderle, Frankfurt am Main, DE;
Tabea Pfuhl, Dieburg, DE;
DiaMonTech AG, Berlin, DE;
Abstract
A method and apparatus for analyzing a substance is disclosed. An optical medium is arranged on a substance surface with at least one region of the optical medium surface in contact with the substance surface. An excitation light beam is emitted through the contacting region of the medium surface (to the substance surface. A measurement light beam is emitted through the optical medium to the contacting region of the medium surface such that the measurement light beam and the excitation light beam overlap on the interface of the optical medium and of the substance surface, on which the measurement light beam is reflected. A deflection of the reflected measurement light beam is detected in dependence on the wavelength of the excitation light beam. The substance is then analyzed based on the detected deflection of the measurement light beam in dependence on the wavelength of the excitation light beam.