The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 02, 2023

Filed:

Apr. 15, 2020
Applicant:

Viavi Solutions Inc., San Jose, CA (US);

Inventors:

Driss Touahri, Nepean, CA;

Christopher Russell Wagner, Kanata, CA;

Assignee:

VIAVI SOLUTIONS INC., Chandler, AZ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/18 (2006.01); G01J 3/14 (2006.01); G01J 3/26 (2006.01); G01J 3/28 (2006.01); G01J 3/12 (2006.01);
U.S. Cl.
CPC ...
G01J 3/18 (2013.01); G01J 3/14 (2013.01); G01J 3/26 (2013.01); G01J 2003/1204 (2013.01); G01J 2003/1208 (2013.01); G01J 2003/262 (2013.01); G01J 2003/283 (2013.01);
Abstract

A system for a high resolution optical spectrum analyzer (OSA) using an efficient multi-pass configuration is disclosed. The system may include an entrance slit to allow inward passage of an optical beam. The system may also include a grating element to diffract the optical beam. The system may further include a retroreflective element to retroreflect the optical beam. The system may also include a mirror to reflect the optical beam. The system may include an exit slit, which in some examples may be adjacent to the entrance slit. The exit slit may allow outward passage of the optical beam for a high resolution optical measurement.


Find Patent Forward Citations

Loading…