The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 02, 2023
Filed:
Sep. 28, 2020
Nidek Co., Ltd., Aichi, JP;
Michihiro Takii, Aichi, JP;
Kyoji Takeichi, Aichi, JP;
Yuya Nakako, Aichi, JP;
Takaaki Matsui, Aichi, JP;
Mattia Minozzi, Albignasego, IT;
Nicola Codogno, Albignasego, IT;
Federico Carraro, Albignasego, IT;
NIDEK CO., LTD., Aichi, JP;
Abstract
An eyeglass frame shape measurement device includes an optical measurement unit, a probe unit, a holding unit that holds the optical measurement unit and the probe unit, a changing portion that integrally moves the optical measurement unit and the probe unit with respect to an eyeglass frame to change a measurement position with respect to a groove of a rim of the eyeglass frame, and a controller that controls an operation of the eyeglass frame shape measurement device. The controller controls an operation of the changing portion to measure the groove of the rim of the eyeglass frame, acquires a cross-sectional shape of the groove of the rim of the eyeglass frame based on a detection result detected by the optical measurement unit, and acquires a shape of the rim of the eyeglass frame based on a detection result detected by the probe unit.