The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 25, 2023

Filed:

Jun. 28, 2021
Applicant:

Fujitsu Limited, Kawasaki, JP;

Inventors:

Takeshi Kodama, Yokohama, JP;

Ken Yokoyama, Kawasaki, JP;

Assignee:

FUJITSU LIMITED, Kawasaki, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 43/0829 (2022.01); H04L 43/08 (2022.01);
U.S. Cl.
CPC ...
H04L 43/0829 (2013.01); H04L 43/08 (2013.01);
Abstract

A method of an abnormality detection, the method including: calculating an occurrence degree of a packet loss in each of multiple queues on the basis of a first time period in which each of multiple processes that receives a packet is in a waiting state and an arrival frequency of a packet in each of the multiple queues that stores the packets received by the multiple processes; distributing the number of packet losses occurred in a communication device that includes the multiple queues to each of the multiple queues on the basis of the calculated occurrence degree; and determining whether or not an abnormality occurs in each of the multiple processes on the basis of a correspondence relationship between an operation state of each process and the number of packet losses distributed to the queue that corresponds to each process among the multiple queues for each of the multiple processes.


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