The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 25, 2023

Filed:

Apr. 17, 2020
Applicant:

Denka Company Limited, Tokyo, JP;

Inventors:

Akira Yoda, Tokyo, JP;

Tatsuya Nagai, Tokyo, JP;

Tetsuya Ito, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C09C 1/48 (2006.01); H01M 4/62 (2006.01); C09C 1/56 (2006.01); H01M 4/04 (2006.01); H01M 4/1391 (2010.01); H01M 4/505 (2010.01); H01M 4/525 (2010.01); H01M 10/0525 (2010.01);
U.S. Cl.
CPC ...
H01M 4/625 (2013.01); C09C 1/56 (2013.01); H01M 4/0404 (2013.01); H01M 4/1391 (2013.01); H01M 4/505 (2013.01); H01M 4/525 (2013.01); H01M 4/623 (2013.01); H01M 10/0525 (2013.01); C01P 2004/62 (2013.01); C01P 2006/22 (2013.01); C01P 2006/40 (2013.01);
Abstract

A slurry including at least a carbon black and a dispersion medium, wherein a concentration of the carbon black in the slurry is 5% by mass or more and 25% by mass or less, and wherein in a volume-based frequency distribution of particle size of the carbon black measured by a laser diffraction/scattering method, provided that a volume concentration of carbon black with a particle size of 0.6 μm or more is x (%), a volume concentration of carbon black with a particle size of 0.3 μm or more and less than 0.6 μm is y (%), and a volume concentration of carbon black having a particle size of less than 0.3 μm is 100−(x+y) (%), the slurry satisfies 10≤x≤70, 30≤y≤90, and 0≤100−(x+y)≤30.


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