The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 25, 2023
Filed:
May. 03, 2021
Applicant:
SK Hynix Inc., Icheon-si, KR;
Inventors:
Hyeong Soo Jeong, Icheon-si, KR;
Dong Beom Lee, Icheon-si, KR;
Assignee:
SK hynix Inc., Icheon-si, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/36 (2006.01); G11C 29/46 (2006.01); G11C 29/44 (2006.01); G11C 7/10 (2006.01);
U.S. Cl.
CPC ...
G11C 29/36 (2013.01); G11C 7/106 (2013.01); G11C 7/1063 (2013.01); G11C 7/1087 (2013.01); G11C 29/44 (2013.01); G11C 29/46 (2013.01); G11C 2029/3602 (2013.01);
Abstract
An apparatus includes a selection data generation circuit configured to generate selection data from fuse data or generate the selection data having a preset test input pattern, depending on whether a failure test is entered; and a failure flag generation circuit configured to generate latch data by latching the selection data, and generate a failure flag by detecting whether the latch data has a preset test pattern.