The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 25, 2023
Filed:
Nov. 03, 2020
Hyundai Motor Company, Seoul, KR;
Kia Motors Corporation, Seoul, KR;
Seoul National University R&db Foundation, Seoul, KR;
Sung Wook Lee, Seoul, KR;
Seong-Cheol Kim, Seoul, KR;
Joo Hyun Park, Seoul, KR;
Byeong-Ho Lee, Seoul, KR;
Wanjei Cho, Seoul, KR;
HYUNDAI MOTOR COMPANY, Seoul, KR;
KIA MOTORS CORPORATION, Seoul, KR;
SEOUL NATIONAL UNIVERSITY R&DB FOUNDATION, Seoul, KR;
Abstract
An allophone inspection device and inspection method thereof are provided. An allophone inspection device includes an array microphone unit in which a plurality of array microphones are disposed at predetermined intervals, and a controller configured to build reference data by quantifying analyzed allophone by collecting sound signals generated from surrounding based on a position where the array microphone unit is installed in advance and measure a surrounding sound signal through the array microphone unit to estimate whether or not noise is generated and a position of the sound source where the noise is generated based on the reference data.