The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 25, 2023

Filed:

Nov. 19, 2019
Applicant:

Meta Platforms, Inc., Menlo Park, CA (US);

Inventors:

Heng Wang, Mountain View, CA (US);

Du Le Hong Tran, Palo Alto, CA (US);

Antoine Miech, Redwood City, CA (US);

Lorenzo Torresani, Norwich, VT (US);

Assignee:

Meta Platforms, Inc., Menlo Park, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 20/40 (2022.01); G06N 20/00 (2019.01); G06K 9/62 (2022.01); G06V 20/00 (2022.01);
U.S. Cl.
CPC ...
G06V 20/46 (2022.01); G06K 9/6256 (2013.01); G06N 20/00 (2019.01); G06V 20/35 (2022.01); G06V 20/49 (2022.01); G06V 20/44 (2022.01);
Abstract

In one embodiment, a method includes accessing a first set of images of multiple images of a scene, wherein the first set of images show the scene during a time period. The method includes generating, by processing the first set of images using a first machine-learning model, one or more attributes representing observed actions performed in the scene during the time period. The method includes predicting, by processing the generated one or more attributes using a second machine-learning model, one or more actions that would happen in the scene after the time period.


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