The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 25, 2023
Filed:
Aug. 12, 2020
Toyota Jidosha Kabushiki Kaisha, Toyota, JP;
Shun Sato, Nagoya, JP;
TOYOTA JIDOSHA KABUSHIKI KAISHA, Toyota, JP;
Abstract
The process control system converts, into images, time-varying waveforms of inspection data of an assembled product, parts, and sub-assembling processes that constitute the assembling process, performs matching between an inspection waveform image (IWI) of the assembled product and a predetermined deterioration pattern image (DPI), determines whether IWI of the assembled product is similar to DPI, performs, when IWI is similar to DPI, a first determination for performing matching between an IWI of each of sub-assembling processes and DPI and determining whether there is a sub-assembling process similar to DPI, performs, when there is a sub-assembling process similar to DPI in the first determination, a second determination for performing matching between IWI of each of parts assembled in the sub-assembling process similar to DPI and DPI and determining whether there is a part similar to DPI, and specifies a deterioration factor based on results of the first and second determinations.